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GlyCORE Imaging Core
The University of Mississippi

JSM-7200 FESEM

JEOL JSM-7200FLV Field-Emission Scanning Electron Microscope (FESEM)

This advanced microscope with high magnification and ultrahigh spatial resolution capabilities enables high-quality imaging and analysis of micro and nanostructures. It is equipped with multiple detectors, including an Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors, enabling advanced analysis of various sample types.

SEM Core instrumentation

JEOL JSM-7200FLV FESEM at the Microscopy and Imaging Center

Specifications of the FESEM:

          Accelerating voltage            0.01 kV to 30 kV

          Probe current                        1 pA to 300 nA

          Magnification                        Up to x1,000,000

          Resolution                              Up to 1.2 nm

Detectors

  1. Secondary Electron (SE) detector
    • Everhart-Thornley type in-chamber Lower electron detector (LED), and
    • Through-the-lens (TTL)/Upper electron detector (UED)
  2. Back-Scattered Electron (BSE) detector
    • Retractable BE detector (RBED) with COMPO and SHADOW modes
  3. Energy Dispersive X-Ray Spectroscopy (EDS) detector
    • Oxford Instruments X-MaxN 80 EDS with AztecEnergy 5.0 software
  4. Scanning Transmission Electron Microscopy (STEM) detector
    • Deben Retractable motorised Annular STEM, HAADF/MAADF/LAADF/BF, with 12 position STEM converter holder for 3mm TEM grids
  5. Cathodoluminescence (CL) detector
    • Deben Centaurus monochromatic CL detector

Other Features

  • Low vacuum (LV) capability
  • Gentle Beam (GB) mode
  • Charge-free (CF) scan
  • Schottky-type thermal field emission gun
  • 5-axis, motorized stage
  • Trackball, touchpad, mouse and keyboard operation
  • Stage navigation system
  • Chamber scope
  • 65″ LCD display
  • Windows 10 Professional Operating System
  • Film thickness monitor
  • Data backup
  • Uninterruptible power supply

Denton Desk V TSC Sputter Coater

Denton Vacuum Desk V_TSC sputter coater

The Desk V sputter coater is used to prepare samples for SEM analysis. This fully automated sputter coater is designed for high-resolution electron microscopy. It is equipped with metal sputtering (Platinum) and carbon evaporation capabilities, oil-free turbo molecular pump, film thickness monitor and tilting/rotating specimen table for uniform coating. The unit is supplied with argon gas.

Leica EM CPD300 Critical Point Dryer

Leica EM CPD300 critical point dryer

A critical point dryer is essential for preparing delicate biological specimens for SEM imaging. The Leica EM CPD300 is an advanced, fully automated unit capable of drying delicate materials for high-quality imaging. This unit uses liquid CO2(critical point 31.1 °C at 1072 psi) as a transitional medium.

Rates

User Fee

Services

UM Rate

External Academic Rate
Sample preparation, SEM imaging and EDS analysis

$75/hr

$110/hr
Hands-on training on SEM operation and sample preparation (min. 4 hrs)

$75/hr

$110/hr
Demonstration for student groups (4-5 students per group)

$75/hr

$110/hr

 

User Fee Policies

  • The hourly rate for using the Core services is $75 for internal (UM) users and $110 for academic users external to UM.
  • The fee is applicable to all users. No discounts or special rates are available.
  • No user will be charged a lower rate than users paying with federal funds. Charges to federal grants/contracts will not subsidize instruments.
  • User fees are reviewed annually and subject to changes.
  • The costs of essential consumables (aluminum stubs, carbon tapes, etc.) are included in the fee. The users are responsible for any other special materials required for preparing their samples.
  • Users will be charged the hourly rate for the first hour and then in increments of 30 minutes. A grace period of up to 10 minutes will be allowed when possible, but continued use beyond 10 minutes will be charged for 30 minutes.
  • User time is assessed by the actual SEM lab use time (the time the lab is unavailable for others, including the time it takes to set up the room and protocol, sample preparation, image analysis, and clean up) and not by the scan time alone. For example, if a user reserved the system for 2 hours but completed the work in 1 hour 30 minutes, they will only be billed for 1 hour 30 minutes.
  • Users are encouraged to finalize their work within the time reserved and leave the lab promptly so that the next user can use the lab immediately.
  • The facility is also available for other external users. Please contact us for commercial rates.

Invoicing and Payment

  • Invoices will be emailed to the investigator’s fiscal contact during the second week of the month for services provided in the previous month.
  • Payments are due within 30 days of the invoice date. If payment is not received within three billing cycles, the user cannot make new reservations until all the pending invoices are paid in full.
  • We strive to determine the most efficient approach to achieving each user’s research goals and will make our best effort to generate high quality, reliable results.  However, we cannot guarantee that we can produce particular results in any research project. Payment is expected for services rendered, not contingent on a positive experimental outcome.